Our profilometer systems feature fast and accurate non-contact measurement combined with user-friendly software for data acquisition and analysis. They utilize different sensing technologies resulting in measuring speeds several times faster than tactile techniques without damaging the surface.
Using white light scanning technology our high-end confocal microscope offers high resolution and accuracy while being free of any optical artifacts.
Solarius' non-contact measurement systems are used extensively in R&D, quality control and manufacturing environments for various surface measurement tasks such as surface finish (roughness) analysis, structure of sub-micron surface features, surface flatness measurement, wear analysis and surface fault detection.
Our diverse customer
base covers a wide variety of industries such as Semiconductor, Thick
Film, Electronics, Automotive, Engineering Surfaces, Aerospace, MEMS, Storage
Media, Medical and Paper.